This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections "Instrumentation, Methodology" and "Biology, Medicine" for electronic industry. This book includes contributions żeby renowned researchers and experts in this field.
Since a large amount of time in both astronomy and astrophysics is spent on theoretical and observational physics, a detailed explanation of...620,81 zł
This book provides substantial information on thermal insulation. Thermal insulation is fundamentally defined as the technique of reduction of...362,52 zł
This book attempts to understand the multiple branches of analytical chemistry and it also presents the researches happening across the globe...620,81 zł
This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine...580,92 zł
This book provides insight into major facets of the physics of quantum gravity. The application of quantum field theory for explaining gravity...362,52 zł
Introduction to biogas, including its technology as well as principles, has been provided in this well-structured and descriptive book. It encompasses...640,61 zł
Opinie i recenzje użytkowników
Dodaj opinie lub recenzję dla Encyclopedia of scanning electron microscopy. Twój komentarz zostanie wyświetlony po moderacji.